Generation of Controlled Analog Emissions from Embedded Devices using Software Stress Methods
Abstract
In this paper, we present a new method that uses software diagnostic tools to study the generation of induced spurious physical emissions from embedded devices over air-gapped (remote) channels. With this methodology, spurious emissions are induced during controlled computer operations such as dynamic memory allocation, hard disk writing and computations. Each stressing operation creates a pulse in an amplitude shift keying scheme. These software techniques can provide repeatable measurements of embedded devices for mapping unwanted emissions over air-gapped channels.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 2017
- Accession Number
- AD1041934
Entities
People
- Israel Pérez
- John D. Rockway
- Jonathan H. Nelson
- Kristopher Buchanan
- Oren Sternberg
- Sara Wheeland
Organizations
- Naval Information Warfare Center Pacific