Evanescent Waves in High Numerical Aperture Aplanatic Solid Immersion Microscopy: Effects of Forbidden Light on Subsurface Imaging (Open Access, Publisher's Version)

Abstract

The collection of light at very high numerical aperture allows detection of evanescent waves above the critical angle of total internal reflection in solid immersion lens microscopy. We investigate the effect of such evanescent modes, so-called forbidden light, on the far-field imaging properties of an aplanatic solid immersion microscope by developing a dyadic Greens function formalism in the context of subsurface semiconductor integrated circuit imaging. We demonstrate that the collection of forbidden light allows for sub-diffraction spatial resolution and substantial enhancement of photon collection efficiency albeit inducing wave-front discontinuities and aberrations.

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Document Details

Document Type
Technical Report
Publication Date
Mar 24, 2014
Accession Number
AD1042068

Entities

People

  • Abdulkadir Yurt
  • Aydan Uyar
  • Bennett B. Goldberg
  • M. S. Ünlü
  • T. B. Cilingiroglu

Organizations

  • Boston University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Confocal Microscopy
  • Detectors
  • Diffraction
  • Electric Fields
  • Evanescent Waves
  • Failure Analysis
  • Far Field
  • Integrated Circuits
  • Light Sources
  • Materials Science
  • Microscopy
  • Numerical Aperture
  • Optical Analysis
  • Optical Images
  • Optics
  • Refractive Index
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Image Processing and Computer Vision.
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.

Technology Areas

  • Microelectronics