Electrodeposition of Metal Matrix Composites and Materials Characterization for Thin-Film Solar Cells
Abstract
We have demonstrated that metal matrix composites, which consist of silver-multi-walled carbon nanotube-silver, layer-by-layer stack, can electrically bridge the cracks (>40 m) that appear in the semiconductor substrates and the composite grid lines. This gap bridging was proven to be repeatable through strained-to-failure/closed-gap repeat cycles. For device demonstration, the composites were integrated onto commercial triple-junction cells, and the composite-enhanced cells showed strong crack-tolerance, maintaining >95% of the short circuit current upon substrate fracture. By contrast, the conventional metallization led to >50%loss in short circuit current. The composite metallization was also superior in minimizing the overall efficiency loss against fracture, compared to the conventional metallization. During the project extension period, we have initiated composite materials modeling and circuit modeling to establish microstructure-mechanical/electrical property relationship.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 04, 2017
- Accession Number
- AD1045887
Entities
People
- Sang M Han
Organizations
- University of New Mexico