Measurement of Refractive Indices of CdSiP2 at Temperatures from 90 to 450 K (Postprint)

Abstract

Ordinary and extraordinary refractive indices of CdSiP2 were measured and a Sellmeier equation was obtained, for the first time to our knowledge over the temperature range 90 to 450 K. The index values were used to calculate the crystal temperature and phase-matching angle dependence of the generated wavelengths in nonlinear frequency conversion of a range of pump wavelengths. A good match was obtained between the calculated values of the wavelengths and some experimental measurements.

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Document Details

Document Type
Technical Report
Publication Date
Jan 05, 2018
Accession Number
AD1047669

Entities

People

  • Douglas M. Krein
  • Frank K. Hopkins
  • Jean Wei
  • Joel M. Murray
  • Kevin T. Zawilski
  • Peter G Schunemann
  • Shekhar Guha

Organizations

  • Universal Energy Systems

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Air Force
  • Air Force Facilities
  • Air Force Research Laboratories
  • Conversion
  • Crystals
  • Equations
  • Frequency
  • Frequency Conversion
  • Governments
  • Low Temperature
  • Materials
  • Measurement
  • Optical Materials
  • Refractive Index
  • Resonant Frequency
  • Single Crystals

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Spectroscopy.