Instrumentation for Linear and Nonlinear Optical Device Characterization

Abstract

The Pl has acquired six pieces of equipment to extend capabilities for linear and nonlinear device characterization. The requested equipment spans a large wavelength range and will provide new resources for spatial, temporal and frequency domain studies and control. The new measurements will complement existing equipment for photonic and nanostructures studies already in the Pis lab such as a spectrometer, visible and near infrared lasers, modulators, and waveguide characterization equipment. The access to both higher speed measurements, phase control, and new spectral regions will enable powerful materials and device characterization.

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Document Details

Document Type
Technical Report
Publication Date
Jan 31, 2018
Accession Number
AD1049917

Entities

People

  • Juliet T. Gopinath
  • V. M. Bright
  • W. Park

Organizations

  • Regents of the University of Colorado

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors
  • Space

DTIC Thesaurus Topics

  • Abstracts
  • Amplifiers
  • Angular Momentum
  • Cameras
  • Detectors
  • Frequency
  • Frequency Domain
  • Infrared Cameras
  • Infrared Lasers
  • Instrumentation
  • Laser Applications
  • Lasers
  • Materials
  • Measurement
  • Modulators
  • Monitors
  • Optical Materials
  • Optical Modulators
  • Orbital Angular Momentum
  • Oscillators
  • Oscilloscopes
  • Phase Control
  • Pulse Generators
  • Repetition Rate
  • Signal Processing
  • Spectroscopy

Readers

  • Image Processing and Computer Vision.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Software Engineering

Technology Areas

  • Directed Energy
  • Microelectronics