DURIP: An Ultrafast Testbed for Comprehensive Characterization of Photonics, Electronic, and Optoelectronic Properties of Inegrated Nanophotonic Structures
Abstract
In this DURIP program an ultrafast characterization test bed for the characterization of high speed integrated photonic devices such as high-speed integrated photonic modulators and detectors was developed. A major requirement in performing successful research in this field is the availability of ultra-fast optoelectronic characterization tools that facilitate the study of ultrafast low-power devices and systems (e.g., modulators, switches, detectors). This characterization setup has been an enabling platform for development of ultrafast, compact, and low-power high speed optoelectronic devices under several DoD grants, including ARO-funded program for the development of ultrafast graphene-based modulators and several other programs supported by ONR, DARPA, and AFOSR. The developed characterization test bed has provided Adibis groupat Georgia-Tech with an integrated ultrafast characterization tools, which has greatly enhanced its capability in fast and accurate characterization of high-speed integrated optoelectronic for the study of the device physics and high-speed device optimizations. The tool is also available to other research group at Georgia-Tech and outside researches as a shared facility.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 14, 2017
- Accession Number
- AD1051355
Entities
People
- Ali Adibi
Organizations
- Georgia Tech Research Corporation