Radiation Effects in Ultra-Wide Bandgap AlN Schottky Diodes
Abstract
Ultra-wide bandgap AlN Schottky diodes were fabricated by metal organic chemical vapor deposition and tested under gamma-ray and proton radiation conditions. The breakdown voltage and leakage currents were found to be strongly dependent on the temperature and surface area of the diodes. Radiation effects degraded forward currents slightly but had little impact on the crystal quality.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 12, 2018
- Accession Number
- AD1052606
Entities
People
- Hong Chen
- Houqiang Fu
- Jossue Montes
- Xuanqi Huang
- Yuji Zhao
Organizations
- Arizona State University