Characterization of 2D Jammed Granular Memristive Copper Arrays

Abstract

A novel sensor made of jammed granular memristive copper spheres was explored in an effort to develop a protection technology that could be used in non-proliferation treaty monitoring. The micro-copper spheres were annealed for various times at a constant temperature. SEM, EDS, and XPS were used to characterize the growth of the oxide coating. Electrical characterization of the device was done by confining the granular copper spheres to a two-dimensional plane using a unique test fixture capable of measuring I-V curves at the boundary of the circuit board using tungsten pillar electrodes. Electroforming of the copper spheres produced soft dielectric breakdown in the oxide layer, creating conductive filaments. It was shown that the conductivity of the filaments increased by reduction of the copper oxide using a field-driven process. Similarly, the conductivity of the filament decreased via oxidation assisted by Joule heating. The affects of mechanical force on the conductive filaments were also studied. The changes in the electrical resistance can be used as a detection and sensing mechanism for electromechanical interferences.

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Document Details

Document Type
Technical Report
Publication Date
Mar 24, 2016
Accession Number
AD1053905

Entities

People

  • Len L Kedrwo

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Counter WMD
  • Energy and Power Technologies
  • Sensors

DTIC Thesaurus Topics

  • Air Force
  • Circuit Boards
  • Construction
  • Crystal Structure
  • Department Of Defense
  • Detection
  • Detectors
  • Energy
  • Energy Transfer
  • Governments
  • Intrusion Detectors
  • Materials Science
  • Oxide Films
  • Phase Transformations
  • Test Fixtures
  • Two Dimensional
  • United States Government

Fields of Study

  • Materials science

Readers

  • Integrated Circuit Design and Technology.
  • Plasma Physics.
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems