Determining the Binding Mechanisms of Nitro Group Containing Explosives on Metal Oxide Semiconductor Surfaces

Abstract

This project will use nonlinear laser spectroscopic surface analysis techniques to study how nitro-group containing explosives (e.g., TNT, RDX, HMX, PETN) bind to metal oxide semiconductor (MOS) surfaces in the presence of atmospheric water vapor, oxygen, and environmental contaminants. This information can be used to understand which MOS materials would lead to solid-state trace explosive vapor detectors that have low enough detection limits and fast enough response times to be useful for tactical applications.

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Document Details

Document Type
Technical Report
Publication Date
Jul 19, 2018
Accession Number
AD1057058

Entities

People

  • William E. Asher

Organizations

  • University of Washington

Tags

Communities of Interest

  • Advanced Electronics
  • Counter IED
  • Sensors

DTIC Thesaurus Topics

  • Detection
  • Detectors
  • Explosives
  • Explosives Detection
  • Films
  • Frequency
  • Hydrogen Bonds
  • Laser Beams
  • Metal Oxide Semiconductors
  • Metal Oxides
  • Monomolecular Films
  • Optical Materials
  • Oxides
  • Oxygen
  • Semiconductors
  • Single Crystals
  • Titanium Dioxide

Readers

  • Agricultural Chemistry/Soil Science
  • Integrated Circuit Design and Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Graphene