Polarized Optical Microscope and Scanning Tunneling Microscope for a Hierarchical Material Characterization System
Abstract
The aim was to acquire a variable temperature polarized optical microscope (POM) and a scanning tunneling microscope (STM), which together constituted a system for the purpose of characterizing hierarchical nanostructures at different length scales. The "Hierarchical Material' Characterization System", thereafter called System, which include two analytical instruments, namely a McCrone Variable Temperature Polarized Optical Microscope ($46,316) and a Nanosurf NairoSTM Scanning Tunneling Microscope ($11,731).
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 07, 2017
- Accession Number
- AD1058712
Entities
People
- Adam B Braunschweig
Organizations
- University of Miami