Design Science for Radiation-effects Rate Prediction and Development of Error-immune Circuitry
Abstract
The overall goal of this project at Brown University in collaboration with Vanderbilt University and MIT-Lincoln Labs was to create a validated methodology for predicting single-event error rates and to design complex radiation-tolerant integrated circuits. The project followed three fundamental thrusts: 1) development of a statistical technique to predict the radiation- induced and thermal fluctuation-induced single-event upset (SEU) rate; 2) development of an error-immune circuit design style; and 3) validation of the design methodology and the statistical error-prediction technique using a fully-depleted (FD) SOI CMOS fabrication technology.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 2018
- Accession Number
- AD1063219
Entities
People
- A. Zaslavsky
- B. Bhuva
- J. Mundy
- M. L. Alles
- R. A. Weller
- R. D. Schrimpf
- R. I. Bahar
- Robert A. Reed
- W. R. Patterson
Organizations
- Brown University