Advanced Imaging and Micromanipulation System for High-Speed Characterization of Multifunctional, Hierarchical Structures (AIM-FAST)

Abstract

Crosby and Emrick purchased the Advanced Imaging and Micromanipulation system, capable of high-speed, high resolution image acquisition (AIM-FAST). This instrument system is built on a ZEISS Axiovert Observer 7 optical microscope, equipped with a piezoelectric scanning stage, a Hamamatsu ORCA 7 imaging system, and an Eppendorf micromanipulation and microinjection platform. This device is designed especially for mechanical measurements of mesostructured materials, including the hierarchical mesostructures, called "mesoscale polymers", which we have developed through support from the Army Research Office (ARO/W911NF-14-1-0185) MSPs are created with unique geometries, such as helices or grid-like sheets, which can dynamically change over a broad range of relevant length and time scales. AIM-FAST enables the structural, mechanical, and electrical property characterization of our MSP library. Furthermore, through laboratory training and coursework, AIM-FAST will provide a great opportunity to train future engineers and scientists on the intricacies of micro- and nanoscale manipulation, high speed imaging, as well as how small scale structure property relationships translate to macroscale materials performance.

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Document Details

Document Type
Technical Report
Publication Date
Dec 30, 2016
Accession Number
AD1064250

Entities

People

  • Alfred J Crosby
  • Todd Emrick

Organizations

  • University of Massachusetts Amherst

Tags

Communities of Interest

  • Human Systems

DTIC Thesaurus Topics

  • Abstracts
  • Acquisition
  • Agreements
  • Carbon Fibers
  • Composite Materials
  • Department Of Defense
  • Electrical Properties
  • Engineering
  • High Resolution
  • Materials
  • Materials Science
  • Mathematics
  • Measurement
  • Mechanical Properties
  • Military Research
  • Quantum Dots
  • Students

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Research Science/Academic Research