Electron Drift Mobility of Degenerate Semiconductors Due to Ionized Impurity Scattering-Phase 1
Abstract
Study of the electron drift mobility of degenerate semiconductors due to ionized impurity scattering and the electron drift mobility of degenerately doped zinc oxide (ZnO). The objectives for Phase I was to derive analytical expressions for the electron mobility of degenerate semiconductors dominated by ionized impurities, including non-parabolic conduction bands, wave function admixture, Rode-Cetnar screening, impurity compensation, and multiply ionized impurities. Also to compare calculated numerical results to results for classical parabolic bands and Thomas-Fermi screening.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 2019
- Accession Number
- AD1071253
Entities
People
- D. L. Rode