Two-Photon Absorption Induced Charge Generation for Single-Event Effects Studies

Abstract

Nonlinear-optical (NLO) approaches were first introduced for the purpose of investigating single-event effects (SEE) in microelectronics in 2002. The primary approach utilized to date is based on two-photon absorption (TPA), in which two sub-bandgap photons are absorbed simultaneously by the material (typically silicon), creating a single electron hole pair. Recent efforts have focused on putting TPA SEE approaches on a quantitative footing. This paper discusses recent developments in that regard.

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Document Details

Document Type
Technical Report
Publication Date
Mar 25, 2019
Accession Number
AD1075225

Entities

People

  • Ani Khachatrian
  • Dale McMorrow
  • Jeffrey H. Warner
  • Joel M. Hales
  • S. Büchner

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Absorption
  • Data Sets
  • Demographic Cohorts
  • Dose Rate
  • Dosimetry
  • Energy
  • Energy Transfer
  • Excitation
  • Ions
  • Laser Pulses
  • Lasers
  • Measurement
  • Nonlinear Optics
  • Photons
  • Pulsed Lasers
  • Three Dimensional
  • Two Photon Absorption

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics