Probing Ion Radiation Effects in Si Crystal by 3D Integrated Resonating Thin Diaphragms
Abstract
We report on experimental study and analysis of the effects of energetic heavy ion radiation upon mechanical properties of single-crystal silicon (Si) diaphragm resonators, by exploiting a novel 3D scheme of using a vertical stack of 5micromachined vibrating Si diaphragms exposed to energetic oxygen ions. We have observed different frequency redshifts indifferent layers in the stack, which can be explained by different types and magnitudes of damage induced by the oxygen ions radiation. The integration design not only scientifically enables probing different radiation effects in a 3D fashion, but also economically evades very expensive, repetitive tests on individual devices, which provides a powerful tool for the investigation of radiation effects on MEMS and other micro/nanoscale systems.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 25, 2019
- Accession Number
- AD1075820
Entities
People
- Hailong Chen
- Hao Jia
- Michael L. Alles
- Michael W. McCurdy
- Peter Hung
- Philip X. -l. Feng
- Robert A. Reed
- Ronald D. Schrimpf
Organizations
- Case Western Reserve University