RHBD Techniques for a Sub-Sampling Phase-Locked Loop in 32nm PD-SOI
Abstract
This work details radiation-hardened by design (RHBD) techniques applied to a 15GHz sub-sampling quadrature phase-locked loop (PLL) in the 32nm partially-depleted silicon-on-insulator (PD-SOI) technology node. Radiation vulnerabilities are identified and both component and system level techniques are utilized to mitigate them. This work will provide RF circuit RHBD insight at 32nm PD-SOI and contribute to existing RHBD infrastructure.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 25, 2019
- Accession Number
- AD1076077
Entities
People
- E.W.T. Richards
- J. S. Kauppila
- L. W. Massengill
- T. D. Loveless
- Timothy D. Haeffner
- W. T. Holman
Organizations
- Vanderbilt University