Determination of Nanomaterials' Film Thickness Using Filmetrics F40-UV Thin-Film Analyzer: Standard Operating Procedure Series: Characterization (C)

Abstract

Optical measurement techniques have been widely used for the determination of thin film thicknesses and optical constants. This standard operating procedure (SOP) presents a specific protocol for the determination of nanomaterial thin-film thicknesses and their optical constants including the refractive index (RI) and the extinction coefficient using a Filmetrics F40-UV Thin Film Analyzer. Procedures and recommendations of instrument preparation and parameters, sample measurement, and results analysis are included. The procedure applies to a wide range of nanomaterial thin films in the thickness range from approximately 4 nm to 25 micrometer.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2019
Accession Number
AD1077727

Entities

People

  • Kathryn Kremer
  • Qihua Wu
  • Stephen Gibbons

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Analyzers
  • Charge Coupled Devices
  • Coefficients
  • Ecology
  • Engineering
  • Engineers
  • Extinction
  • Films
  • Light Sources
  • Materials
  • Measurement
  • Nanomaterials
  • Reflectance
  • Refractive Index
  • Standards
  • Thickness
  • Thin Films

Readers

  • Aerosol Science/Aerosol Physics
  • Nanocomposite Materials Science
  • Structural Dynamics.