High Speed Optoelectronic Device Characterization System

Abstract

With this equipment funding support, we acquired a Keysight N4357D 26.5 GHz single-mode lightwave component analyzer (LCA) and ssociated source/voltage test units for high-speed membrane laser research, as well as other extreme photonic devices and integrated chip testing. The N4375D LCA is based on the new 4-port N5222A PNA Series microwave network analyzer with high RF output power. This enables both small signal analysis and large signal analysis on device under test. 1310 nm and 1550 nm laser sources were included in the system for modulators and detector measurement at these wavelengths. The system is capable of high speed laser characterization.

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Document Details

Document Type
Technical Report
Publication Date
Dec 06, 2018
Accession Number
AD1078127

Entities

People

  • Weidong Zhou

Organizations

  • University of Texas at Arlington

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Analyzers
  • Detectors
  • Laser Diodes
  • Lasers
  • Light Sources
  • Materials
  • Materials Science
  • Measurement
  • Microwave Networks
  • Modulators
  • Optoelectronic Devices
  • Photonic Crystals
  • Photonic Devices
  • Quantum Dot Lasers
  • Semiconductors
  • Students
  • Training

Readers

  • Integrated Circuit Design and Technology.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Research Science/Academic Research

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems