High-Resolution X-Ray Diffractometer for Advanced Epitaxial Thin-Film and Nanoscale Materials Characterization

Abstract

The major goal of this project was for the Center for High Technology Materials (CHTM) at the University of New Mexico (UNM) to specify, order, acquire, install, and qualify a new state-of-the-art high-resolution X-ray diffractometer to support Department of Defense (DoD) research related to advanced epitaxial thin-film and nanoscale materials growth and characterization.

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Document Details

Document Type
Technical Report
Publication Date
Apr 05, 2019
Accession Number
AD1083754

Entities

People

  • Daniel Feezell
  • Francesca Cavallo
  • Ganesh Balakrishnan
  • Mahmoud R. Taha
  • Sang E. Han
  • Tito Busani

Organizations

  • University of New Mexico

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Department Of Defense
  • Detectors
  • Diffraction
  • Epitaxial Growth
  • Films
  • High Resolution
  • High Temperature
  • Measurement
  • Military Research
  • Optoelectronic Devices
  • Power Electronics
  • Scattering
  • Semiconductors
  • Thin Films
  • X Rays
  • X-Ray Reflectometry

Readers

  • Research Science/Academic Research
  • Semiconductor Device Technology