All-ALD Hafnia and Ferrite-Based Multiferroics for CMOS-Compatible Tunable Microwave Applications

Abstract

Major Goals: 1) Demonstrate the feasibility of a commercial deposition process for a multi-ferroic multilayer film by first demonstrating deposition by scalable processes separately for high quality ferroelectric and ferromagnetic thin films on substrates compatible with CMOS processing. The deposition process and any postdeposition processing must be compatible with CMOS processing. In general, this will require the initial film deposition and subsequent processing steps including any annealing to be at temperatures below 450C. 2) Determine film quality by scanning electron microscopy, energy dispersive spectroscopy, x-ray diffraction/x-ray reflectivity, atomic force microscopy and Rutherford backscattering. 3) Determine the dielectric loss tangent for the films separate from the substrate. Determine remnant and maximum polarization and coercive field of the ferroelectric film and saturation polarization of the magnetic film. 4) Demonstrate piezomagnetic coefficient of > 5 ppm/Oe and magnetic loss tangent < 5% at 1 GHz for the magnetic film and dielectric loss tangent of < 1% for the ferroelectric film at room temperature. Accomplishments: 1) We demonstrated the deposition of ferroelectric strontium-doped hafnia (SHO) and ferromagnetic cobalt ferrite (CFO) thin films by atomic layer deposition. Film thickness was varied between 10 and 50 nm. Strontium doping was varied between 2 and 10 at%. CFO readily crystalized at deposition temperatures above 300 C, however we found the crystalization temperature of SHO was increased by higher Sr doping levels and that at 2 at%, SHO crystalized above 500 C. 2) We characterized the quality of our SHO and CFO films by SEM, EDS, XRD/XRR, AFM, and RBS. We grew SHO and CFO on bare (100) Si as well as (111) oriented Pt and polycrystaline TiN buffer layers and other substrates as well.

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Document Details

Document Type
Technical Report
Publication Date
Oct 17, 2018
Accession Number
AD1084605

Entities

People

  • James Mccambridge

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Dielectric Permittivity
  • Diffraction
  • Electric Fields
  • Electrical Properties
  • Electron Microscopy
  • Ferrites
  • Films
  • Frequency
  • Magnetic Fields
  • Magnetic Films
  • Magnetic Properties
  • Materials
  • Microscopy
  • Resonance
  • Scanning Electron Microscopy
  • Thin Films
  • X Rays

Fields of Study

  • Materials science
  • Physics

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene