Radiation Effects in 2D Heterostructure Devices
Abstract
The overall objective of this project was to develop a fundamental understanding of radiation-induced defects in heterostructure devices fabricated using 2D materials, including the atomic-scale nature and location of defects in the heterostructures, the impact of these defects on operation for both lateral and vertical electronic transport, and the potential characterization, device fabrication and characterization, radiation and reliability effects, and density-functional-theory (DFT) calculations to develop a fundamental understanding of radiation-induced defects in these devices.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 31, 2019
- Accession Number
- AD1086283
Entities
People
- Daniel M. Fleetwood
- En Xia Zhang
- Eric M Vogel
- Sokrates T. Pantelides
Organizations
- Georgia Tech