Calibration for Medium Resolution Off-Axis Electron Holography Using a Flexible Dual-Lens Imaging System in a JEOL ARM 200F Microscope

Abstract

In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35 nm to2.5 ?m. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (?) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.

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Document Details

Document Type
Technical Report
Publication Date
Jun 30, 2014
Accession Number
AD1094095

Entities

People

  • Arturo Ponce
  • Fernando Mendoza-Santoyo
  • Francisco Ruiz-zepeda
  • Jesus Cantu-Valle
  • Miguel Jose-yacama

Organizations

  • University of Texas at San Antonio

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Biomedical
  • Sensors

DTIC Thesaurus Topics

  • Amplitude
  • Calibration
  • Department Of Defense
  • Dynamic Range
  • Electron Microscopes
  • Electron Microscopy
  • Electron Optics
  • Holograms
  • Materials
  • Metallic Nanoparticles
  • Microscopes
  • Microscopy
  • Nanoparticles
  • Nanotechnology
  • Optics
  • Particles
  • Standards

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Nanoscale Plasmonic Nanotechnology
  • Optical Physics and Photonics.

Technology Areas

  • Biotechnology
  • Microelectronics
  • Space