Atomic Scale Modeling of Equilibrium and Transport Properties at Metal Dielectric Interfaces

Abstract

This project provided DFT modeling work in order to understand defect energetics in dielectrics around conductor/dielectric interfaces and the influence of electric fields on them. The project included two components: First, we identified the correct method to determine point defect energetics along with experimental validation for two systems, Zn1-xMgxO with point defects quantified by cathodoluminescence (collaborator: Brillson, OSU) and two-dimensional BN sheets where defects where directly counted in TEM images (collaborators: Duscher and Gu, UTK). We found that of the different methods in the literature, only stoichiometry balancing agrees with experiment. Second, we investigated the effect of electric fields on point defects in doped Zn-ZnO junctions. Schottky type band curvature resulted in Zn vacancies having the lowest energy away from the interface while ohmic-type curvature resulted in O vacancies having the lowest energy at the interface. These results indicate that clustering of O and Zn vacancies would occur at the different ends of a metal-oxide-metal structure.

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Document Details

Document Type
Technical Report
Publication Date
Oct 23, 2019
Accession Number
AD1096572

Entities

People

  • Wolfgang Windl

Organizations

  • Ohio State University

Tags

DTIC Thesaurus Topics

  • Air Force Research Laboratories
  • Band Gaps
  • Band Structures
  • Ceramic Materials
  • Charge Carriers
  • Computational Science
  • Density Functional Theory
  • Dielectrics
  • Energy Bands
  • Fermi Levels
  • Materials
  • Materials Science
  • Metal-Semiconductor Junctions
  • Scattering
  • Semiconductors
  • Silicon Carbide
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Quantum Chemistry
  • Semiconductor Device Technology