Trap Characterization in Ultra-Wide Bandgap Al0.65ga0.4n/Al0.4Ga0.6N MOSHFET's with ZrO2 Gate Dielectric Using Optical Response and Cathodoluminescence [Appl. Phys. Lett. 115, 213502 (2019)]

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Document Details

Document Type
Technical Report
Publication Date
Dec 09, 2019
Accession Number
AD1098215

Entities

People

  • Asif Khan
  • Charles R. Eddy
  • Grigory Simin
  • Kamal Hussain
  • M V Chandrashekhar
  • Md. Didarul Alam
  • Mikhail Gaevski
  • Mohi Uddin Jewel
  • Shahab Mollah
  • Virginia D. Wheeler

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  • United States Naval Research Laboratory

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