Bias-Modulated Nanoscale Terahertz Linear and Nonlinear Spectroscopy

Abstract

Major Goals: In the last few years, imaging below the diffraction limit has become one of the most active topics in the field of terahertz science. A key development that has enabled these results is the use of a metal tip, such as the tip in an atomic force microscope (AFM). This tip can be held in close proximity (perhaps 10 nm) to a sample surface, and illuminated from the far field with terahertz radiation. The scattering of light off this tip-sample junction is sensitive to the dielectric properties of the region of the sample directly underneath the tip, so nanoscale dielectric information can be extracted from the signal. We have recently broadened the scope of this technique to include nonlinear terahertz spectroscopy in the near field. Instead of illuminating the tip with a terahertz signal, we use a near-infrared (800 nm) femtosecond pulse as the illumination source, and measure the THz radiation generated by the sample, in the vicinity of the AFM tip. Laser THz emission microscopy (LTEM) is a well-known and powerful tool for ultrafast spectroscopy. Our new results have translated this nonlinear technique into the nanoscale, as a complementary tool to our existing THz scattering microscope. Here, we propose an exploratory project under the Short-Term Innovative Research (STIR) program, to develop a potentially transformative advance for these existing nanoscopy tools. We will investigate the use of a DC bias applied to the AFM tip as a means for modulating the samples properties on the nanoscale. A large static DC field can have several different effects on the photophysics of condensed matter systems. In semiconductors, DC fields can induce carrier depletion as a field effect, or carrier multiplication through avalanche charge generation. In addition, a static electric field can cause a non-resonant modification of a samples dielectric function through the DC Kerr effect.

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Document Details

Document Type
Technical Report
Publication Date
Jul 31, 2019
Accession Number
AD1099104

Entities

People

  • Daniel Mittleman

Organizations

  • Brown University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Detection
  • Diffraction
  • Electric Fields
  • Frequency
  • Geometry
  • Lasers
  • Light Sources
  • Measurement
  • Nanostructures
  • Near Field
  • Optics
  • Radiation
  • Repetition Rate
  • Scattering
  • Semiconductors
  • Terahertz Radiation
  • Time Domain

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Nanoscale Plasmonic Nanotechnology
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.

Technology Areas

  • Directed Energy
  • Microelectronics