The Study of Radiation Effects in Emerging Micro and Nano Electro Mechanical Systems (M and NEMs)
Abstract
The potential of micro and nano electromechanical systems (M and NEMS) has expanded due to advances in materials and fabrication processes. A wide variety of materials are now being pursued and deployed for M and NEMS including silicon carbide (SiC), III-V materials, thinfilm piezoelectric and ferroelectric, electro-optical and 2D atomic crystals such as graphene, hexagonal boron nitride (h-BN), and molybdenum disulfide (MoS2). The miniaturization, functionality and low-power operation offered by these types of devices are attractive for many application areas including physical sciences, medical, space and military uses, where exposure to radiation is a reliability consideration. Understanding the impact of radiation on these materials and devices is necessary for applications in radiation environments.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 09, 2016
- Accession Number
- AD1111241
Entities
People
- Alex Zettl
- Brian D Homeijer
- Bruce Alphenaar
- Charles N. Arutt
- Cory D. Cress
- Evan R. Glaser
- Huiqi Gong
- J. L. Davidson
- Jacob L. Jones
- Ji-Tzuoh Lin
- Juejun Hu
- Kevin Walsh
- Kirill Bolotin
- Louis Hutin
- Michael L. Alles
- Mo Li
- Nazanin Bassiri-Gharb
- Philip X Feng
- Pranoy Deb Shurva
- Qingyang Du
- Robert A. Reed
- Robert A. Weller
- Robert M. Proie
- Ronald D. Schrimpf
- Ronald G. Polcawich
- Ryan Nicholl
- Shamus McNamara
- Thang Toan Pham
- Thomas Ernst
- Wenjun Liao
Organizations
- United States Naval Research Laboratory