Implantable Thermal Runaway Trigger Device

Abstract

A modified battery cell for simulating failure conditions includes an electrical cell and a controllable voltage source. A transistor gate is joined to a positive output of the source and to a negative tab of the cell at the transistor source. One side of a resistor implanted in the cell is joined to the transistor drain and the other side is joined to the cell positive tab. Controlling voltage source voltage allows current to flow from the transistor source to the transistor drain and through the resistor. Current flow through the resistor causes heating within the electrical cell that can be monitored to simulate an electrical cell failure. A method for testing an electrical cell is also provided.

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Document Details

Document Type
Technical Report
Publication Date
Dec 30, 2020
Accession Number
AD1118929

Entities

People

  • Charles J. Patrissi
  • Jason Mercier

Organizations

  • Naval Undersea Warfare Center

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accumulators
  • Bipolar Junction Transistors
  • Body Regions
  • Cells
  • Charge Carriers
  • Chemical Reactions
  • Circuits
  • Control Systems
  • Detectors
  • Disassembly
  • Electrical Equipment
  • Electrochemical Cells
  • Electrodes
  • Electronic Circuits
  • Electronic Components
  • Energy
  • Field Effect Transistors
  • Lithium Ion Batteries
  • Materials
  • Metal Oxide Semiconductors
  • Particles
  • Resistance
  • Resistors
  • Semiconductor Devices
  • Semiconductors
  • Short Circuits
  • Transistors

Fields of Study

  • Engineering
  • Materials science

Readers

  • Battery Technology and Engineering
  • Electrical Engineering
  • Electronics Engineering