Improved ICEPIC Secondary Electron Emission Modeling
Abstract
This report details the technical results of a year-long effort to improve the secondary electron emission (SEE) model within the AFRL particle-in-cell code ICEPIC, for incident electrons in the range of 10 keV to 500 keV. The simulation code GEANT4 was used to generate SEE statistics across a range of incidence energies and angles using seven typical materials found within high power microwave devices: copper, stainless steel, aluminum, niobium, graphite, aluminum oxide (alumina), and beryllium oxide. A parametric model was defined and demonstrated to fit the available data. Due to the relatively large uncertainty in the available SEE data at high incidence energies, the authors recommend that future work in this area focus on obtaining more data for high-incident energy electrons, which can then be used to tune and/or refine the model as appropriate.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 07, 2020
- Accession Number
- AD1124664
Entities
People
- Allycia Gariepy
- Forrest H Phillips
- Scott A. Rice
Organizations
- Applied Research Associates (United States)