Intentional Electromagnetic Irradiation on a Microcontroller: Review of Upset Variation with Respect to Chip Instance
Abstract
In the area of electromagnetic effects on electronics the most challenging technical problem is to understand and model the process of upset for digital systems. AFRL has chosen to study microcontrollers to act as a model for more complex systems due to their relative simplicity, ease of programming and control. Using a state-of-the-art automated testing system called SALVO, pulsed RF signals were direct-injected into the clock-line pin of a microcontroller (MCU) using careful timing. The MCU is programmed in assembly language to execute a simple binary count from 0-7, and the output of the MCU is monitored to establish whether the count has deviated beyond the nominal state, meaning an upset has occurred. A batch of 0851 architecture Atmel microcontrollers were subjected to IEMI testing to determine the variability in injected power required to induce upset.10 identical Atmel Microcontrollers were exposed to a fixed frequency EM pulse injected on the clock input at two distinct pulse durations; each time starting at a low pulse power level and increasing the power in 1 dB increments up to 20 W. The overall results reveal that the batch of MCU chips, with the expectation of M02, had extremely similar PoE values across the power range and pulse durations tested.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 2019
- Accession Number
- AD1124980
Entities
People
- Daniel Guillette
- Timothy Clarke
Organizations
- Air Force Research Laboratory