Impact of Radiation Damage on Mechanical and Electrical Properties of MEM/NEM Structures
Abstract
This 3-year research project applied experimental measurements and theoretical calculations to quantify mechanisms and manifestations of radiation effects on constituent MEM/NEM (M and NEM) materials and structures, including radiation-induced defects and resulting modification of mechanical properties of thin-film and 2D materials and devices. 2D materials are of particular interest due to the unique properties afforded by low atomic dimension in (at least) one direction. The same low-dimensional property also introduces questions as to mechanisms and models for interaction with radiation and how defects impact the mechanical properties.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 05, 2021
- Accession Number
- AD1134702
Entities
People
- Alex Zettl
- Brian Homeijer
- Kirill I. Bolotin
- Michael L. Alles
Organizations
- Sandia National Laboratories
- University of California, Berkeley
- Vanderbilt University