Energy Storage in Nanocapacitors: Fabricating and Evaluating Demonstration Units to Understand Degradation Mechanisms
Abstract
A systematic study of nanolayer alumina capacitors has been performed under electric field close to 1 GV/m. Such electric fields cause leakages due to the field emission effect. Such high electric field can also enable an injection of electrical charges (electrons) in the dielectric. Asymmetric charge distributions have been achieved due to the selectivity of the quantum tunneling process. Namely, the electrons cannot tunnel to a region near cathode, where the total energy would be less than the potential energy. This mechanism exhibits a strong tendency to populate charge traps located near the anode, i.e., the regions where their potential energy is the lowest. This charge injection allows a permanent storage of the bulk charge even if the capacitor plates are short-circuited, provided that the temperature is sufficiently low so that the conductivity of the dielectric is negligible. In our experiments, the total charge stored in the dielectric was up to seven and a half times higher than the charge stored on the capacitor plates. Also, measurements of the breakdown voltage show that the breakdown electric field, i.e., the dielectric strength, is independent of the thickness of the dielectric.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 29, 2021
- Accession Number
- AD1139981
Entities
People
- Alexey Bezryadin
Organizations
- University of Illinois Urbana–Champaign