Time Reduction of the Polishing Procedure for B4C-SiC Layered Composites

Abstract

Specimens made from a boron carbide and silicon carbide composite were polished using standard metallographic techniques. Scanning electron microscope images were taken at regular intervals during polishing to determine the minimum time for each polishing step before moving on. Using these images, a new procedure was created that reduced the time spent to polish a sample by 45 from the previous method. The new procedure was verified by comparing scanning electron microscopy images of the final polished surface to those of the previous, lengthier procedure. No significant differences were found, so the new procedure was considered suitable for use.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2021
Accession Number
AD1142168

Entities

People

  • Jerry C LaSalvia
  • Kristopher D. Behler
  • Tucker W. Moore

Organizations

  • United States Army Combat Capabilities Development Command

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abrasives
  • Aluminum Oxides
  • Boron Carbides
  • Carbides
  • Ceramic Materials
  • Ceramic Matrix Composites
  • Composite Materials
  • Compound Semiconductors
  • Electron Microscopes
  • Electron Microscopy
  • Finishes
  • Grain Size
  • Materials
  • Materials Science
  • Microscopes
  • Microscopy
  • Scanning Electron Microscopes
  • Scanning Electron Microscopy
  • Silicon Carbide
  • Technical Ceramics
  • Test Methods

Readers

  • Computational Modeling and Simulation
  • Materials Science and Engineering.
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics