AlGaN and AlGaN-Based Quantum Wells: Towards High-Power High-Frequency Electronics
Abstract
Terahertz spectroscopy is an important tool for non-contact, non-destructive characterization of materials. From the transmission and reflection properties of samples through THz time domain and continuous wave spectroscopy it is possible to extract the dielectric properties of materialssamples as well as the nanoscale transport properties of these. We have demonstrated this previously in complex oxides [1-2]. During this project, as research objective, we focused on the THz characterization of III-Nitrides through THz spectroscopy as well as explored the potentials of these materials for terahertz applications. We also developed new techniques and approaches towards materials characterization, which we employed not only in III-Nitrides, but also in other wide bandgap semiconductors.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 25, 2021
- Accession Number
- AD1153214
Entities
People
- Berardi Sensale-Rodriguez
Organizations
- University of Utah