Fundamental Research Into Radiation Effects in Cryogenic Electronics Technologies

Abstract

The overall goal of this fundamental research project was to expand the state-of-the-art understanding of radiation interactions in relevant cryogenic CMOS technologies at and below 180 nm feature sizes. This goal was accomplished through the innovative design of test chips for radiation characterization in a commercially available CMOS technology relevant to the focal plane array (FPA) and read-out-integrated circuit (ROIC) cryogenic electronics communities, and the development of a modeling strategy analysis of radiation effects degradation mechanisms, and for prediction of the natural space radiation effects response. Results have been presented to the radiation effects community in the form of journal and conference submissions, through technical interchange meetings, and through the release of technology characterization vehicle (TCV) and circuit test vehicle (CTV) design files. Full manuscripts are included as appendices.

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Document Details

Document Type
Technical Report
Publication Date
Nov 06, 2021
Accession Number
AD1158237

Entities

People

  • T. D. Loveless

Organizations

  • University of Tennessee at Chattanooga

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Complementary Metal-Oxide Semiconductors
  • Computer-Aided Design
  • Department Of Defense
  • Detection
  • Electronics Laboratories
  • Field Effect Transistors
  • Focal Plane Arrays
  • Government Procurement
  • Governments
  • Integrated Circuits
  • Logic
  • Logic Gates
  • Metal Oxide Semiconductors
  • Power Electronics
  • Readout Integrated Circuits
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Defense Technology Research and Development.
  • Integrated Circuit Design and Technology.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics
  • Space