Broadband Scanning Microwave Microscopy of Phosphorene

Abstract

This research project aims to develop a broadband scanning microwave microscope (SMM) for the characterization of the electromagnetic properties of 2D atomic-layered materials. The work was carried out through a close collaboration between the PI at the Marche Polytechnical University in Italy and the co-PI at Lehigh University and Cornell University. The main technical accomplishments through the past four years included examinations of biological and semiconductor specimens. As shown in the Final Progress Report, many papers were published.

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Document Details

Document Type
Technical Report
Publication Date
Jan 11, 2022
Accession Number
AD1161263

Entities

People

  • James C. M. Hwang
  • Marco Farina

Organizations

  • Cornell University
  • Polytechnic University of the Marches

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force Research Laboratories
  • Aluminum Nitrides
  • Aluminum Oxides
  • Bandwidth
  • Broadband
  • Capacitance
  • Cells
  • Cellular Structures
  • Chemistry
  • Compound Semiconductors
  • Electrical Impedance
  • Electrical Properties
  • Electromagnetic Properties
  • Equivalent Circuits
  • Materials
  • Materials Science
  • Microscopes
  • Microscopy
  • Semiconductors
  • Silicon Carbide
  • Transmission Lines
  • Two Dimensional
  • Two-Dimensional Materials

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Research Science/Academic Research
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics