Epitaxial Growth and Characterization of Cubic Boron Nitride
Abstract
Cubic boron nitride is a promising material for high power and high temperature electronic devices owing to its large band gap (tilde 6.4 eV) and high thermal conductivity. We report here on the growth of epitaxial films of undoped and Si-doped c-BN on diamond substrates by ion beam-assisted MBE and their characterization by scanning TEM, FTIR, XPS, AFM, and Hall effect transport measurements. In addition, we report on the role that trace amounts of Mg plays in enabling the growth of c-BN.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 27, 2022
- Accession Number
- AD1176095
Entities
People
- Andrew C. Lang
- Bradford B. Pate
- David F. Storm
- Neeraj Nepal
- Sergey I Maximenko
- Tatyana Feygelson
Organizations
- United States Naval Research Laboratory