Report on Geiger Counter Technique for X-Ray Diffraction Part I - Spectrometer for Measuring Powder Diffraction Patterns
Abstract
A Geiger counter x-ray spectrometer for powder diffraction is described in this report. The counters are almost 100 percent efficient when used with target radiations from molybdenum to chromium, The spectrometer employs a focusing geometry which yields intense diffraction patterns. For the purpose of chemical identification, the counter spectrometer is many time as fast as cameras of equivalent resolutions. It simplifies the technique and extends the range of X-ray diffraction in quantitative chemical analysis. Spacings are measurable from 1.0 to 150 with copper radiation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 16, 1944
- Accession Number
- AD1181433
Entities
People
- Herbert Friedman
- Laverne S. Birks
Organizations
- United States Naval Research Laboratory