Geiger Counter Technique UE for X-Ray Diffraction Part 2 - A Method of Determining Thickness of Thin Coatings

Abstract

For most materials, the mass absorption coefficient, J-t, and the density, 0, are known or readily measured, The ratio of transmitted to incident intensity, Ix/I0 , is generally measured with a Geiger counter or ionization chamber. Measurements of this type are treated in NRL Report M-1799, where it is shown that reliable results are obtainable for thicknesses varying from hundred thousandths of an inch, using soft X-rays, to as high as several inches with high voltage radiation. The present report describes a method of adapting X-ray transmission for measuring thin coating or plating thicknesses from one side.

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Document Details

Document Type
Technical Report
Publication Date
Feb 28, 1944
Accession Number
AD1181676

Entities

People

  • Herbert Friedman
  • Laverne S. Birks

Organizations

  • United States Naval Research Laboratory

Tags

DTIC Thesaurus Topics

  • Absorption Coefficients
  • Continuous Spectra
  • Counters
  • Diffraction
  • Electron Microscopes
  • Errors
  • Geiger Counters
  • Intensity
  • Ionization
  • Ionization Chambers
  • Materials
  • Measurement
  • Permanent Magnets
  • Radiation
  • Scattering
  • Soft X Rays
  • Spectra
  • Surface Roughness
  • X Rays

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Nuclear and Radiation Engineering.
  • Systems Analysis and Design