Comparison of Operating Atmosphere Impact on La0.7Sr0.3V3.86-X (LSV) Intermediate-Temperature Solid Oxide Fuel Cell Sulfur Tolerance Explored through Experimental and Modeling Characterization Over Time

Abstract

Solid Oxide Fuel Cells (SOFCs) have the potential to provide clean, secure, and highly efficient sustainable energy for the U.S. Army. SOFCs can use many different reformed hydrocarbon fuels to obtain hydrogen for power generation, which include externally reformed JP-8, or can directly feed alternative fuels scavenged in theater. One long-term problem, specific for the U.S. Army, is sulfur performance degradation, common in most fuel options. JP-8 is not commonly desulfurized, and any scavenged fuel could be contaminated with sulfur. One solution to this problem could be the anode catalyst material, La0.7Sr0.3VO3.86-x (LSV), which has previously demonstrated significant sulfur tolerance at temperatures greater than 700 deg. C. This study further investigates LSVs sulfur tolerance at intermediate temperatures (400-700 deg. C) in hydrogen and methane atmospheres up to 100 hours, where it was observed to be up to 278-287x more tolerant than Ni-YSZ (700 deg. C), believed to be due to electronic/ionic changes occurring during exposure.

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Document Details

Document Type
Technical Report
Publication Date
Oct 09, 2022
Accession Number
AD1182536

Entities

People

  • Talia M. Sebastian
  • Theodore E. Burye

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Adsorption
  • Alternative Fuels
  • Atomic Structure
  • Base Metal
  • Cells
  • Crystal Structure
  • Density Functional Theory
  • Department Of Defense
  • Dielectrics
  • Electron Electron Interactions
  • Energy
  • Failure Analysis
  • Fuel Cells
  • Fuels
  • Ground Vehicles
  • Heat Of Activation
  • High Temperature
  • Hydrocarbon Fuels
  • Information Operations
  • Literature Surveys
  • Materials
  • Mott Insulators
  • Oxides
  • Solid Oxide Fuel Cells

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  • Petroleum Engineering

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  • Biotechnology
  • Microelectronics