Analysis of Thermal Stability of Morphology in Certain Polymers Using X-ray Scattering
Abstract
In this study, X-ray scattering was combined with in situ heating to at least 200 deg. C to determine the morphological stability of a series of thermoplastics typically used in high-temperature applications. Poly (phenyl sulfone) (PPSU), poly(ether imide)(PEI), and a proprietary blend based primarily on polycarbonate (PC) showed the best thermal stability. Samples of poly (oxymethylene) (POM), poly (p-phenylene sulfide) (PPS), impact-modified high-temperature nylon, and filled high temperature nylon all exhibited changes in morphology as a function of temperature. POM exhibited strong crystallinity at room temperature and displayed a sharp melting transition around 170 deg.C, becoming a free-flowing liquid. The small-angle X-ray scattering data indicate that the POM crystallites begin to change as early as 130 deg. C. In contrast, PPS crystallized upon heating, at approximately 105 deg. C. PPS was found to be morphologically unstable at only 70 deg. C. The results from this study suggest that PPSU, PEI, and the PC-siloxane product studied here may be considered thermally stable under these testing conditions.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 2022
- Accession Number
- AD1182952
Entities
People
- Frederick L Beyer
- Randy A. Mrozek
Organizations
- United States Army Research Laboratory