Correlative Study of Defects in Semiconductors (Research Topic Area: 4.3 Electronic Sensing)

Abstract

Major Goals: (1) to achieve a comprehensive understanding of specific types of structural defect (e.g., threading dislocations) in terms of their microscopic structure and impact on electronic and optical properties; (2) to understand how a collection of defects can affect the mesoscale (or macroscale) electrical and optical behavior of optoelectronic materials; and (3) to explore the potential impact of defects on device performance in different applications and under different operating conditions.

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Document Details

Document Type
Technical Report
Publication Date
Apr 26, 2021
Accession Number
AD1186633

Entities

People

  • Yong Zhang

Organizations

  • University of North Carolina at Charlotte

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Gaps
  • Diffraction
  • Electron Density
  • Electrons
  • Emission
  • Energy Bands
  • Films
  • Kinetic Energy
  • Materials
  • Optical Properties
  • Optics
  • Power Electronics
  • Raman Scattering
  • Semiconductor Devices
  • Semiconductors
  • Solar Cells
  • Thin Films
  • Three Dimensional

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics