Intentional Iron Diffusion in Beta-Ga2O3
Abstract
This report details efforts to selectively dope Beta-Ga2O3. Doping was achieved through diffusion source layers containing Mg, Fe, Sn, and indium. SIMS analysis is presented to show the depth of diffusion of the different species. Experiments showed that diffusion is a viable method to selectively dope gallium oxide.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 05, 2019
- Accession Number
- AD1204249
Entities
People
- J. Neil Merrett
- Jacob Lawson
- Kevin Bray
Organizations
- Air Force Research Laboratory
- University of Dayton