An F-M Test Set for Microwave Oscillators
Abstract
Previous methods of analyzing the low-frequency noise spectrum of microwave oscillators have employed the usual scanning type spectrum analyzer or an arrangement of fixed-tuned filters. The visual presentation of the spectrum analyzer makes high accuracy difficult, while a series of filters does not provide the necessary frequency discrimination. The present system makes use of a chart recorder to present noise level versus frequency as a continuous plot from 0 to 16,000 cycles.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 27, 1948
- Accession Number
- AD1208286
Entities
People
- E. F. Mcclain
- R. C. Giles
Organizations
- United States Naval Research Laboratory