Electronic Structure of Ultra-Wide Bandgap Semiconductor Surfaces and Interfaces

Abstract

Experimental capabilities were developed that can directly probe the interface region in ultra-wide bandgap (UWBG) heterostructures and thereby provide fundamental information about the interface electronic properties (e.g., barrier height, band offset) that are critical to electronic device performance. These capabilities are based on a new custom light source that can be tuned across an extremely broad spectral range (NIR to DUV), thereby enabling the use of internal photoemission and other threshold photoexcitation techniques to probe the interface, surface, and bulk electronic structure in UWBG materials. By using these techniques in combination with a surface analysis system that provides complementary chemical and lattice structure information, systematic studies can be used to gain a better understanding of epitaxial UWBG materials and device structures under development. Ultimately, this research can provide a scientific foundation to guide the design and fabrication of high-power electronic device technology based on next-generation UWBG materials that is of critical importance to the Navy.

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Document Details

Document Type
Technical Report
Publication Date
Nov 30, 2023
Accession Number
AD1215837

Entities

People

  • D. Scott Katzer
  • David F. Storm
  • Joan E. Yater
  • Neeraj Neepal

Organizations

  • United States Naval Research Laboratory

Tags

DTIC Thesaurus Topics

  • Detectors
  • Electron Spectroscopy
  • Electrons
  • Energy Bands
  • Heterojunctions
  • Light Sources
  • Measurement
  • Photoelectric Emission
  • Photoexcitation
  • Semiconductor Devices
  • Semiconductors
  • Silicon Carbide
  • Spectra
  • Spectroscopy
  • Surface Analysis
  • Vacuum
  • Wide Bandgap Semiconductors

Fields of Study

  • Materials science

Readers

  • Medical Imaging.
  • Semiconductor Device Technology
  • Systems Analysis and Design

Technology Areas

  • Microelectronics