Ellipsometry of Thin Films for Mid-Infrared Optoelectronics

Abstract

Major Goals: Acquire a multiangle spectroscopic infrared ellipsometer, manufacturer: J.A. Woollam, make: IRVASE - Setup the IR-VASE instrument in the LSU Nanofabrication Facility - Train users on the IR-VASE - Study the mid-infrared optical properties of HgTe and Ag2Se nanocrystal films provided by our collaborator AyashSahu at NYU - Study the optical properties of noble-transition metal alloy films as a function of temperature. These films are deposited by co-sputtering in the PI's lab.

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Document Details

Document Type
Technical Report
Publication Date
Aug 16, 2023
Accession Number
AD1226857

Entities

People

  • Kevin M McPeak

Organizations

  • Louisiana State University

Tags

Fields of Study

  • Physics

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Research Science/Academic Research
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene