Characterization and Control of Dopants and Defects at the Single-Atom-Scale

Abstract

We report outcomes for an NRL 6.1 Base Program toward development of methods for direct imaging and spectroscopic characterization of atomic-scale defects, and, where possible, electron-beam driven control of defect atom positions to add a new level of understanding and flexibility to the design and production of semiconducting and two-dimensional materials. This work focused on developing precise knowledge of, and control over, the placement of individual dopant atoms that will ultimately permit the tuning of optical and electrical properties of materials for quantum information and photonic applications.

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Document Details

Document Type
Technical Report
Publication Date
Apr 24, 2024
Accession Number
AD1227841

Entities

People

  • Bethany M Hudak

Organizations

  • United States Naval Research Laboratory

Tags

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Semiconductor Device Technology
  • Systems Analysis and Design

Technology Areas

  • Directed Energy
  • Microelectronics
  • Quantum Computing