Insulation Aging Behaviors Characterized with Dielectric Thermal Analysis

Abstract

This is the final report on the study of aging in dielectric insulators under high electric fields and high temperatures. The aging was characterized mainly using broadband dielectric spectroscopy to monitor the change of dynamics in the relaxation processes and the diffusion of charged impurities. This investigation involved a large number of commercially available dielectric materials.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2024
Accession Number
AD1231080

Entities

People

  • Aleta T. Wilder
  • Riccardo Casalini

Organizations

  • United States Naval Research Laboratory
  • University of Texas at Austin

Tags

Fields of Study

  • Materials science

Readers

  • Electronics Engineering
  • Plasma Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics