The Problem of Choosing the Optimum Modules of the Functional Series of Large (Multicrystal) Integrated Circuits,

Abstract

The proposed algorithms make it possible to solve the problem of selecting the modulus for regular digital computer (DC) equipment. In this case the universality of the obtained results is determined by the quality of the preparation and the completeness of the initial information about the functional units of the DC, which can be renewed and supplemented in the process of working with the given algorithms without changing the structure of the program.

Document Details

Document Type
Technical Report
Publication Date
Oct 03, 1974
Accession Number
ADA000154

Entities

People

  • A. V. Kobylinskii
  • O. V. Buzovskii
  • S. A. Ananevskii

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Circuit Testers
  • Circuits
  • Computers
  • Computing Devices
  • Digital Computers
  • Electrical Circuits
  • Electrical Equipment
  • Electronic Circuits
  • Electronic Equipment
  • Integrated Circuits
  • Modules (Electronics)
  • Test Equipment

Fields of Study

  • Engineering

Readers

  • Electronics Engineering
  • Systems Analysis and Design