Charge Transport and Polarization Effects in Dielectrics of MSI/LSI Devices.
Abstract
The purpose of the program was to investigate the magnitude and characteristics of the charge transfer and polarization that occur during an ionization pulse in typical oxide dielectrics used in MSI/LSI devices especially those used for passivation and separation of multilevel metalizations.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1974
- Accession Number
- ADA000833
Entities
People
- Donald P. Snowden
- Roland E. Leadon