Design, Fabrication, and Evaluation of an Electron Beam Addressable High Information Density Memory Tube.

Abstract

During this contract two different electron beam memory tube designs were constructed. Tubes of the Phase I and Phase II designs were successfully operated in a digital memory system. Tube operation at a 10 Mbit rate was the only contract goal not demonstrated. Electronic circuit test equipment design limited write/read rates to 5 Mbits/sec. With the distribution of this report, and the delivery of one Phase II BEAMOS tube to the U.S. Army Electronics Command, the contract will be complete.

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1974
Accession Number
ADA002694

Entities

People

  • Charles Q. Lemmond
  • George E. Possin
  • James K. Fisher
  • Ronald H. Wilson
  • William C. Hughes

Organizations

  • General Electric

Tags

DTIC Thesaurus Topics

  • Circuit Testers
  • Circuits
  • Contracts
  • Electron Beams
  • Electronic Circuits
  • Electronic Equipment
  • Electronics
  • Electrons
  • Fabrication
  • Test And Evaluation
  • Test Equipment

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Electronics Engineering

Technology Areas

  • Directed Energy
  • Microelectronics